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Defect-related density of states in low-band gap InxGa1-xAs/InAsyP1-y double heterostructures grown on InP substrates

Identifieur interne : 00E111 ( Main/Repository ); précédent : 00E110; suivant : 00E112

Defect-related density of states in low-band gap InxGa1-xAs/InAsyP1-y double heterostructures grown on InP substrates

Auteurs : RBID : Pascal:02-0302578

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Abstract

We have measured the excitation-dependent radiative efficiency in a set of lattice-matched InxGa1-xAs/InAsyP1-y double heterostructures incrementally lattice mismatched to InP substrates. We find that the overall rate of defect-related recombination shows little change from the lattice-matched case. However, the excitation-dependent transition between defect-related and radiative recombination changes dramatically with mismatch. While a simple defect recombination model assuming defect levels concentrated near the middle of the band gap fits well for the lattice-matched material, the model does not fit the shape of the efficiency curve for the mismatched structures. We show that the addition of band edge exponential tails to the defect-related density of states gives a much better theoretical fit. © 2002 American Institute of Physics.

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